WebTypical out of plane motion of a good AFM has less than +/- 2nm over 40μm scan range, having repeatability < 0.5 nm with XY offsets of (0, 0), (25μm, 25μm), (25μm, -25μm), (-25μm, 25μm) and (-25μm, -25μm). The repeatability is defined as the maximum variation between the averaged profiles of two or more scans. The tests can be done in ... http://gwyddion.net/download/user-guide/gwyddion-user-guide-en-2009-11-11.pdf
Atomic Force Microscope (AFM)- Definition, Principle, Parts, Uses
http://support.diamond-air.at/da40-tdi_fhb+M52087573ab0.html WebNov 8, 2024 · Atomic force microscopy (AFM) is a technique with multiple applications in biology. This method is a member of the broad family of scanning probe microscopy and was initially developed in 1986 by Binnig et al to overcome the disadvantages of the scanning tunneling microscopy (STM) [1]. In the case of STM, only conductive materials … clima grundtjarn
6.1: Atomic force microscopy (AFM) on Membranes
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